CVE-2026-78116

MEDIUM
Published Oct 21, 2026 Modified Oct 23, 2026 CWE-415

Description

The Broadcom AFBR-S50 time-of-flight sensor driver double-completes an RTIO submission when sensor data evaluation fails. In data_ready_work_handler() (drivers/sensor/broadcom/afbr_s50/afbr_s50.c), a non-STATUS_OK return from Argus_EvaluateData() calls handle_error_on_result(), which finalises the request with rtio_iodev_sqe_err(), but execution then fell through to the tail of the function and finalised the very same struct rtio_iodev_sqe a second time with rtio_iodev_sqe_ok(). Unlike the other error branches in the same function, this one did not return. Both completion helpers reach rtio_executor_done() in subsys/rtio/rtio_executor.c, which returns the submission to the pool via rtio_sqe_pool_free() and, for streaming (multishot) submissions, also releases the RX buffer with rtio_release_buffer(). The second completion therefore reads a freed rtio_iodev_sqe, pushes the same mpsc node onto the submission queue while it is already on the pool free list — splicing the two lists together — and re-submits the freed request so the next measurement is written through an already-released buffer. For one-shot submissions it emits a spurious success completion carrying stale userdata and frees the same pool entry twice. The failure branch is driven by sensor conditions rather than by host software. The vendor API documents statuses such as ERROR_ARGUS_BIAS_VOLTAGE_REINIT and ERROR_ARGUS_LASER_MONITOR_INACTIVE as transient results of harsh ambient light, so a party in front of the optical sensor can provoke the invalid-data condition without any physical contact with the board or any software access; SPI transfer errors reach the same branch. In releases before the payload.Status check was dropped, ordinary sharp distance transitions in the sensor's field of view were sufficient. Impact is corruption of the RTIO submission pool and mempool bookkeeping: aliased submissions, writes through released buffers, and duplicate completions delivered to the application. The attacker does not control the corrupted content, so the practical consequence is memory corruption and loss of availability on devices that instantiate brcm,afbr-s50, rather than directed code execution. Only builds that enable this driver are affected.

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CVSS v3.1 Score

5.2
MEDIUM
CVSS:3.1/AV:P/AC:L/PR:N/UI:N/S:U/C:N/I:L/A:H

EPSS — Exploit Prediction

0.0021
Probability of exploitation
0.11%
Percentile rank

EPSS estimates the probability that this vulnerability will be exploited in the wild within the next 30 days. A higher score means more likely to be exploited.

Weakness Type (CWE)

CWE-415 CWE-415

References

Frequently Asked Questions

What is CVE-2026-78116? +
The Broadcom AFBR-S50 time-of-flight sensor driver double-completes an RTIO submission when sensor data evaluation fails. In data_ready_work_handler() (drivers/sensor/broadcom/afbr_s50/afbr_s50.c), a non-STATUS_OK return from Argus_EvaluateData() calls handle_error_on_result(), which finalises the request with rtio_iodev_sqe_err(), but execution then fell through to the tail of the function and finalised the very same struct rtio_iodev_sqe a second time with rtio_iodev_sqe_ok(). Unlike the other error branches in the same function, this one did not return. Both completion helpers reach rtio_executor_done() in subsys/rtio/rtio_executor.c, which returns the submission to the pool via rtio_sqe_pool_free() and, for streaming (multishot) submissions, also releases the RX buffer with rtio_release_buffer(). The second completion therefore reads a freed rtio_iodev_sqe, pushes the same mpsc node onto the submission queue while it is already on the pool free list — splicing the two lists together — and re-submits the freed request so the next measurement is written through an already-released buffer. For one-shot submissions it emits a spurious success completion carrying stale userdata and frees the same pool entry twice. The failure branch is driven by sensor conditions rather than by host software. The vendor API documents statuses such as ERROR_ARGUS_BIAS_VOLTAGE_REINIT and ERROR_ARGUS_LASER_MONITOR_INACTIVE as transient results of harsh ambient light, so a party in front of the optical sensor can provoke the invalid-data condition without any physical contact with the board or any software access; SPI transfer errors reach the same branch. In releases before the payload.Status check was dropped, ordinary sharp distance transitions in the sensor's field of view were sufficient. Impact is corruption of the RTIO submission pool and mempool bookkeeping: aliased submissions, writes through released buffers, and duplicate completions delivered to the application. The attacker does not control the corrupted content, so the practical consequence is memory corruption and loss of availability on devices that instantiate brcm,afbr-s50, rather than directed code execution. Only builds that enable this driver are affected. It has a CVSS v3.1 base score of 5.2 (MEDIUM).
How severe is CVE-2026-78116? +
CVE-2026-78116 has a CVSS v3.1 score of 5.2 out of 10, rated MEDIUM. This is a medium-severity vulnerability that should be remediated as part of regular maintenance. The EPSS score is 0.0021, placing it in the 0th percentile for exploitation probability.
How do I check if I'm vulnerable to CVE-2026-78116? +
You can use Secably's free Website Scanner to check your website for known vulnerabilities. For infrastructure scanning, use the Port Scanner to identify exposed services that may be affected. Check the vendor advisories linked above for specific patch and version information.

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