CVE-2024-45573
HIGHDescription
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
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CVSS v3.1 Score
Weakness Type (CWE)
Affected Products
| Vendor | Product |
|---|---|
| qualcomm | fastconnect_6700_firmware |
| qualcomm | fastconnect_6700 |
| qualcomm | fastconnect_6900_firmware |
| qualcomm | fastconnect_6900 |
| qualcomm | fastconnect_7800_firmware |
| qualcomm | fastconnect_7800 |
| qualcomm | qcm5430_firmware |
| qualcomm | qcm5430 |
| qualcomm | qcm6490_firmware |
| qualcomm | qcm6490 |
| qualcomm | qcs5430_firmware |
| qualcomm | qcs5430 |
| qualcomm | qcs6490_firmware |
| qualcomm | qcs6490 |
| qualcomm | video_collaboration_vc3_platform_firmware |
| qualcomm | video_collaboration_vc3_platform |
| qualcomm | sc8380xp_firmware |
| qualcomm | sc8380xp |
| qualcomm | sdm429w_firmware |
| qualcomm | sdm429w |
| qualcomm | snapdragon_429_mobile_firmware |
| qualcomm | snapdragon_429_mobile |
| qualcomm | snapdragon_7c\+_gen_3_compute_firmware |
| qualcomm | snapdragon_7c\+_gen_3_compute |
| qualcomm | sc8280xp-abbb_firmware |
| qualcomm | sc8280xp-abbb |
| qualcomm | wcd9370_firmware |
| qualcomm | wcd9370 |
| qualcomm | wcd9375_firmware |
| qualcomm | wcd9375 |
| qualcomm | wcd9380_firmware |
| qualcomm | wcd9380 |
| qualcomm | wcd9385_firmware |
| qualcomm | wcd9385 |
| qualcomm | wcn3620_firmware |
| qualcomm | wcn3620 |
| qualcomm | wcn3660b_firmware |
| qualcomm | wcn3660b |
| qualcomm | wsa8830_firmware |
| qualcomm | wsa8830 |
| qualcomm | wsa8835_firmware |
| qualcomm | wsa8835 |
| qualcomm | wsa8840_firmware |
| qualcomm | wsa8840 |
| qualcomm | wsa8845_firmware |
| qualcomm | wsa8845 |
| qualcomm | wsa8845h_firmware |
| qualcomm | wsa8845h |
References
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